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Denmark – Scanning electron microscopes – The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument…

Danmarks Tekniske Universitet - DTUDeadline 16 Nov 202638511100, 38511000 +1

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